Impact of parametric mismatch and fluctuations on performance and yield of deep submicron CMOS technologies


gives an overview of the de- velopment of the threshold voltage mismatch
A∆VT factors for long n-channel MOS- FETs in submicron CMOS process generations. … indicate
performance dif- ferences between several process flavours of the same technology
Impact of parametric mismatch and fluctuations on performance and yield of deep submicron CMOS technologies

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