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Exploiting memory device wear-out dynamics to improve NAND flash memory system performance


FREE-DOWNLOAD Y Pan, G Dong… – Proceedings of the 9th conference …, 2011
This paper advocates a device-aware design strategy to improve various NAND flash memory
system perfor- mance metrics. It is well known that NAND flash memory program/erase (PE) cycling
gradually degrades memory device raw storage reliability, and sufficiently strong error





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