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A DSP-based ramp test for on-chip high-resolution ADC


FREE-DOWNLOAD W Jiang… – System Theory (SSST), 2011 research 43rd …, 2011
Abstract—Ramp test approach is widely used in analog-to- digital converter (ADC) built-in
self-test (BIST), which gener- ates linear and slow-slope analog ramp signals intended for
histogram-based non-linearity test. The test time can be high for high-resolution ADCs. In





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